OKPECHI, K. U. P.; NWAOKORONGWU, E. C.; JOSEPH, U.; AKWUEGWU, C. O.; EZERE, U. Fabrication and Characterization of Aluminum-Doped Nickel Oxide Thin Films for Optoelectronic Applications using the SILAR Method. UMYU Scientifica, [S. l.], v. 3, n. 4, p. 94–107, 2024. DOI: 10.56919/usci.2434.009. Disponível em: https://scientifica.umyu.edu.ng/index.php/scientifica/article/view/398. Acesso em: 21 nov. 2024.